Flexible Electronics News

Applied Materials Next-Generation Defect Review and Classification Technology Improves Yield for Complex 3D Transistors, 1X Nanometer Nodes

SEMVision G6 system delivers highest resolution and image quality

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By: DAVID SAVASTANO

Editor, Ink World Magazine

Applied Materials, Inc. announced a suite of new defect review and classification technologies for its market-leading SEMVision family of products to accelerate time to yield for leading-edge chip manufacturing at 1X-nm and beyond. The Applied SEMVision G6 defect analysis system combines unprecedented high-resolution, multi-dimensional imaging capabilities with revolutionary machine learning intelligence of the Purity Automatic Defect Classification (ADC) system that sets new performance benchma...

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